NVMe固态硬盘SMART错误日志条目持续增加问题排查求助
我已经连续好几个月收到smart守护进程发来的关于NVMe磁盘的告警邮件，折腾了好久都没找到问题根源，实在没办法了来求助各位大佬！
先给大家看看收到的邮件内容：
I'm getting regular emails from the smart daemon about my NVMe disk.
SMART error (ErrorCount) detected on host: desk
This message was generated by the smartd daemon running on:
host name: [redacted]
DNS domain: [redacted]
The following warning/error was logged by the smartd daemon:
Device: /dev/nvme0, number of Error Log entries increased from 2519 to 2521
Device info:
KBG30ZMV256G TOSHIBA, S/N:X8OPD1PGP12P, FW:ADHA0101
For details see host's SYSLOG.
You can also use the smartctl utility for further investigation.
The original message about this issue was sent at Sat Oct 7 23:38:04 2023 EDT
Another message will be sent in 24 hours if the problem persists.
我尝试了不少命令排查，下面是相关的命令和输出：
1. smartctl -a /dev/nvme0 输出
$ sudo smartctl -a /dev/nvme0 smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.1.0-13-amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: KBG30ZMV256G TOSHIBA Serial Number: X8OPD1PGP12P Firmware Version: ADHA0101 PCI Vendor/Subsystem ID: 0x1179 IEEE OUI Identifier: 0x00080d Controller ID: 0 NVMe Version: 1.2.1 Number of Namespaces: 1 Namespace 1 Size/Capacity: 256,060,514,304 [256 GB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 00080d 04004ad9aa Local Time is: Sun Oct 15 17:53:35 2023 EDT Firmware Updates (0x12): 1 Slot, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x0017): Comp Wr_Unc DS_Mngmt Sav/Sel_Feat Log Page Attributes (0x02): Cmd_Eff_Lg Maximum Data Transfer Size: 512 Pages Warning Comp. Temp. Threshold: 82 Celsius Critical Comp. Temp. Threshold: 85 Celsius Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 3.30W - - 0 0 0 0 0 0 1 + 2.70W - - 1 1 1 1 0 0 2 + 2.30W - - 2 2 2 2 0 0 3 - 0.0500W - - 4 4 4 4 8000 32000 4 - 0.0050W - - 4 4 4 4 8000 40000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 - 4096 0 0 1 + 512 0 3 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02) Critical Warning: 0x00 Temperature: 31 Celsius Available Spare: 100% Available Spare Threshold: 10% Percentage Used: 33% Data Units Read: 35,454,740 [18.1 TB] Data Units Written: 70,575,255 [36.1 TB] Host Read Commands: 306,457,518 Host Write Commands: 881,616,851 Controller Busy Time: 12,766 Power Cycles: 342 Power On Hours: 21,991 Unsafe Shutdowns: 617 Media and Data Integrity Errors: 0 Error Information Log Entries: 2,528 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Temperature Sensor 1: 31 Celsius Error Information (NVMe Log 0x01, 16 of 64 entries) Num ErrCount SQId CmdId Status PELoc LBA NSID VS 0 2528 0 0x301c 0xc002 0x000 - 4 - 1 2527 0 0x201d 0xc004 0x028 - 1 - 2 2526 0 0x101d 0xc004 0x028 - 1 - 3 2525 0 0x6005 0xc002 0x000 - 4 - 4 2524 0 0x6004 0xc004 0x028 - 1 - 5 2523 0 0x5006 0xc004 0x028 - 1 - 6 2522 0 0x1006 0xc005 0x028 - 1 - 7 2521 0 0x4013 0xc005 0x028 - 0 -
2. 其他尝试的排查操作
- 执行了
nvme error-log /dev/nvme0，输出内容已保存到nvme.log文件中 - 执行了
nvme list，输出如下：
$ sudo ./nvme-cli-latest-x86_64.AppImage list Node Generic SN Model Namespace Usage Format FW Rev --------------------- --------------------- -------------------- ---------------------------------------- ---------- -------------------------- ---------------- -------- /dev/nvme0n1 /dev/ng0n1 X8OPD1PGP12P KBG30ZMV256G TOSHIBA 0x1 256.06 GB / 256.06 GB 512 B + 0 B ADHA0101
现在完全摸不着头绪，想请教各位：这些持续增加的错误日志到底是什么原因导致的？会不会影响硬盘的使用寿命或者数据安全？有没有什么办法能解决这个问题？
备注：内容来源于stack exchange，提问作者IMTheNachoMan
