惠普Pavilion笔记本更换充电口后出现系统冻结及孤立inode问题求助

Hey 各位，我最近给我的惠普Pavilion笔记本换了充电口之后，就碰到了烦人的系统冻结问题，想请教下有没有遇到类似情况的朋友能给点思路。

具体情况如下：

• 系统冻结的时间完全没规律，最长一次正常运行了大概13小时才挂掉
• 每次冻结后用fsck检查，从来没报过任何问题；如果在冻结前手动关机，重启时也不会出现孤立inode的提示
• 只有一次在启动时按Esc+F2做文件系统恢复检查，发现有1个损坏的文件，但之后再试就再也复现不了这个情况了

我把smartctl的检测结果贴在下面，供大家参考：

smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.15.0-75-generic] (local build)

Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===

Model Family:     WD Blue / Red / Green SSDs

Device Model:     WDC  WDS500G2B0A-00SM50

Serial Number:    213212806522

LU WWN Device Id: 5 001b44 8bc61fb2d

Firmware Version: 415020WD

User Capacity:    500,107,862,016 bytes [500 GB]

Sector Size:      512 bytes logical/physical

Rotation Rate:    Solid State Device

Form Factor:      2.5 inches

TRIM Command:     Available, deterministic, zeroed

Device is:        In smartctl database [for details use: -P show]

ATA Version is:   ACS-4 T13/BSR INCITS 529 revision 5

SATA Version is:  SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)

Local Time is:    Thu Jun 29 10:35:01 2023 EDT

SMART support is: Available - device has SMART capability.

SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===

SMART overall-health self-assessment test result: PASSED

General SMART Values:

Offline data collection status:  (0x00) Offline data collection activity

was never started.

Auto Offline Data Collection: Disabled.

Self-test execution status:      (   0) The previous self-test routine completed

without error or no self-test has ever

been run.

Total time to complete Offline

data collection:        (    0) seconds.

Offline data collection

capabilities:            (0x11) SMART execute Offline immediate.

No Auto Offline data collection support.

Suspend Offline collection upon new

command.

No Offline surface scan supported.

Self-test supported.

No Conveyance Self-test supported.

No Selective Self-test supported.

SMART capabilities:            (0x0003) Saves SMART data before entering

power-saving mode.

Supports SMART auto save timer.

Error logging capability:        (0x01) Error logging supported.

General Purpose Logging supported.

Short self-test routine

recommended polling time:    (   2) minutes.

Extended self-test routine

recommended polling time:    (  10) minutes.

SMART Attributes Data Structure revision number: 4

Vendor Specific SMART Attributes with Thresholds:

ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE

5 Reallocated_Sector_Ct   0x0032   100   100   ---    Old_age   Always       -       0

9 Power_On_Hours          0x0032   100   100   ---    Old_age   Always       -       11839

12 Power_Cycle_Count       0x0032   100   100   ---    Old_age   Always       -       214

165 Block_Erase_Count       0x0032   100   100   ---    Old_age   Always       -       382465936243

166 Minimum_PE_Cycles_TLC   0x0032   100   100   ---    Old_age   Always       -       1

167 Max_Bad_Blocks_per_Die  0x0032   100   100   ---    Old_age   Always       -       64

168 Maximum_PE_Cycles_TLC   0x0032   100   100   ---    Old_age   Always       -       18

169 Total_Bad_Blocks        0x0032   100   100   ---    Old_age   Always       -       268

170 Grown_Bad_Blocks        0x0032   100   100   ---    Old_age   Always       -       0

171 Program_Fail_Count      0x0032   100   100   ---    Old_age   Always       -       0

172 Erase_Fail_Count        0x0032   100   100   ---    Old_age   Always       -       0

173 Average_PE_Cycles_TLC   0x0032   100   100   ---    Old_age   Always       -       9

174 Unexpected_Power_Loss   0x0032   100   100   ---    Old_age   Always       -       47

184 End-to-End_Error        0x0032   100   100   ---    Old_age   Always       -       0

187 Reported_Uncorrect      0x0032   100   100   ---    Old_age   Always       -       0

188 Command_Timeout         0x0032   100   100   ---    Old_age   Always       -       0

194 Temperature_Celsius     0x0022   076   040   ---    Old_age   Always       -       24 (Min/Max 11/40)

199 UDMA_CRC_Error_Count    0x0032   100   100   ---    Old_age   Always       -       0

230 Media_Wearout_Indicator 0x0032   005   005   ---    Old_age   Always       -       0x0556005a0556

232 Available_Reservd_Space 0x0033   100   100   004    Pre-fail  Always       -       100

233 NAND_GB_Written_TLC     0x0032   100   100   ---    Old_age   Always       -       4897

234 NAND_GB_Written_SLC     0x0032   100   100   ---    Old_age   Always       -       21766

241 Host_Writes_GiB         0x0030   253   253   ---    Old_age   Offline      -       16387

242 Host_Reads_GiB          0x0030   253   253   ---    Old_age   Offline      -       5417

244 Temp_Throttle_Status    0x0032   000   100   ---    Old_age   Always       -       0

SMART Error Log Version: 1

No Errors Logged

SMART Self-test log structure revision number 1

Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error

# 1  Extended offline    Completed without error       00%     11838         -

Selective Self-tests/Logging not supported

备注：内容来源于stack exchange，提问作者noah healy